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API SPEC 14L: Lock Mandrels and Landing Nipples : Reaffirmed

$

273

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API SPEC 20F: Corrosion Resistant Bolting for Use in the Petroleum and Natural Gas Industries : Reaffirmed

$

169

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API TR 5NCL Nickel Content Limits for API 5CT Sour Service Products

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149

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API SPEC 19ICD: Inflow Control Devices : Reaffirmed

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189

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API MPMS CH 23.2: Reconciliation of Liquid Tank Car(s) Quantities : Reaffirmed

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218

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API SPEC 16A: Specification for Drill-through Equipment

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322

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API RP 13B-2: Field Testing Oil-based Drilling Fluids wA1

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388

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ISO 16700:2016

ISO 16700:2016 Microbeam analysis – Scanning electron microscopy – Guidelines for calibrating image magnification

CDN $173.00

SKU: 5532a99d85d9 Category:

Description

ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.

Edition

2

Published Date

2016-07-18

Status

PUBLISHED

Pages

18

Language Detail Icon

English

Format Secure Icon

Secure PDF

Abstract

ISO 16700:2016 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. It does not apply to the dedicated critical dimension measurement SEM.

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