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ICS:37.020
Showing 73–81 of 139 results
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ISO 20263:2024 Microbeam analysis – Analytical electron microscopy – Method for the determination of interface position in the cross-sectional image of the layered materials
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ISO 20473:2007 Optics and photonics – Spectral bands
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ISO 20711:2017 Optics and photonics – Environmental requirements – Test requirements for telescopic systems
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ISO 21073:2019 Microscopes – Confocal microscopes – Optical data of fluorescence confocal microscopes for biological imaging
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ISO 21094:2008 Optics and photonics – Telescopic systems – Specifications for night vision devices
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ISO 21383:2021 Microbeam analysis – Scanning electron microscopy – Qualification of the scanning electron microscope for quantitative measurements
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ISO 21395:2020 Optics and photonics – Test method for refractive index of optical glasses – Part 1: Minimum deviation method
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ISO 21395:2022 Optics and photonics – Test method for refractive index of optical glasses – Part 2: V-block refractometer method
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ISO 21466:2019 Microbeam analysis – Scanning electron microscopy – Method for evaluating critical dimensions by CD-SEM
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