ICS:71.040.40

Showing 46–54 of 126 results

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  ISO 18115:2021 Surface chemical analysis – Vocabulary – Part 2: Terms used in scanning-probe microscopy

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  ISO 18115:2022 Surface chemical analysis – Vocabulary – Part 3: Terms used in optical interface analysis

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  ISO 18115:2023 Surface chemical analysis – Vocabulary – Part 1: General terms and terms used in spectroscopy

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  ISO 18118:2024 Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy – Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

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  ISO 18337:2015 Surface chemical analysis – Surface characterization – Measurement of the lateral resolution of a confocal fluorescence microscope

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  ISO 18392:2005 Surface chemical analysis – X-ray photoelectron spectroscopy – Procedures for determining backgrounds

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  ISO 18394:2016 Surface chemical analysis – Auger electron spectroscopy – Derivation of chemical information

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  ISO 18507:2015 Surface chemical analysis – Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis

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  ISO 18516:2019 Surface chemical analysis – Determination of lateral resolution and sharpness in beam based methods with a range from nanometres to micrometres

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  CDN $351.00 Add to cart