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ICS:71.040.40
Showing 1–9 of 126 results
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ISO 10810:2019 Surface chemical analysis – X-ray photoelectron spectroscopy – Guidelines for analysis
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ISO 11039:2012 Surface chemical analysis – Scanning-probe microscopy – Measurement of drift rate
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ISO 11505:2012 Surface chemical analysis – General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
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ISO 11775:2015 Surface chemical analysis – Scanning-probe microscopy – Determination of cantilever normal spring constants
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ISO 11952:2019 Surface chemical analysis – Scanning-probe microscopy – Determination of geometric quantities using SPM: Calibration of measuring systems
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ISO 12406:2010 Surface chemical analysis – Secondary-ion mass spectrometry – Method for depth profiling of arsenic in silicon
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ISO 12963:2017 Gas analysis – Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
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ISO 12963:2020 Gas analysis – Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration – Amendment 1: Correction to Formula 5
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ISO 13083:2015 Surface chemical analysis – Scanning probe microscopy – Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
CDN $173.00 Add to cart
