Your cart is currently empty!
ICS:71.040.40
Showing 73–81 of 126 results
-
ISO 21079:2008 Chemical analysis of refractories containing alumina, zirconia, and silica – Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) – Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP -AES)
CDN $173.00 Add to cart -
ISO 21222:2020 Surface chemical analysis – Scanning probe microscopy – Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
CDN $173.00 Add to cart -
ISO 21270:2004 Surface chemical analysis – X-ray photoelectron and Auger electron spectrometers – Linearity of intensity scale
CDN $173.00 Add to cart -
ISO 22048:2004 Surface chemical analysis – Information format for static secondary-ion mass spectrometry
CDN $115.00 Add to cart -
ISO 22335:2007 Surface chemical analysis – Depth profiling – Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
CDN $173.00 Add to cart -
ISO 22415:2019 Surface chemical analysis – Secondary ion mass spectrometry – Method for determining yield volume in argon cluster sputter depth profiling of organic materials
CDN $273.00 Add to cart -
ISO 22581:2021 Surface chemical analysis – Near real-time information from the X-ray photoelectron spectroscopy survey scan – Rules for identification of, and correction for, surface contamination by carbon-containing compounds
CDN $173.00 Add to cart -
ISO 22933:2022 Surface chemical analysis – Secondary ion mass spectrometry – Method for the measurement of mass resolution in SIMS
CDN $173.00 Add to cart -
ISO 23124:2024 Surface chemical analysis – Measurement of lateral and axial resolutions of a Raman microscope
CDN $115.00 Add to cart
